Showing results: 316 - 330 of 601 items found.
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Qmax Test Technologies Pvt. Ltd.
Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.
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Extech TG20 -
Extech Instruments Corporation
The TG20 Wire Tracer Kit identifies wire pairs, check continuity and test telephone line polarity. Transmitter has output cables terminated in modular RJ11 phone connector. The non-contact amplifier probe audibly identifies the selected wire or cable so that you can easily trace from source to termination. Comes complete with Wire Tracer Probe and Transmitter with RJ11 phone connector, a pair of alligator clips and two 9V batteries.
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N7040A -
Keysight Technologies
The Keysight N7040A Rogowski coil current probe is designed for measuring AC currents up to 3,000 A with the bandwidth ranging from 3 Hz to 23 MHz. The probe is easy to use because it has a thin, lightweight, flexible and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult to reach parts and confined spaces of a circuit under test. It can also measure large AC current without increase in transducer size.
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Harwin Plc
ATE Probes, Pogo pins and Contact Pads. Gold-plated, spring-loaded, capable of thousands of cycles. Probes for Automated Test Equipment (ATE). Various height SMT contact pins. Flat SMT contact pads. Spring loaded contacts consist of a plunger (or head), barrel (or body), and a fully encapsulated fine spring, to provide the spring force required to maintain positive contact. All have a high durability, exceeding 10,000 mating cycles.
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AUTO DIAGNOSTECH LTD
The Ultimate Probe is an ultimate device that offers multiple test functions that reduces diagnostic time. Applicable to 12V to 24V vehicles with the ability to power components such as radiator fans, starter motors, relays, window regulators, windshield wipers, etc.
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NC-600 -
NAPSON Corp.
*Non-stop and non-contact sheet resistance measuring of thin film on glass runs through on conveyer*1 to 10 number of probe by sizes of glass is attachable*Glass collision prevention function*Continuous test data report to the host computer
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STAr Technologies, Inc.
To meet the requirements on advanced semiconductor testing, STAr Technologies acquired the conductive elastomer interconnect technology and manufacturing capabilities from a leading probe card supplier and enables to provide high performance interposer and test sockets to industry customers.
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850 -
TEGAM Inc.
The ideal solution for anyone that needs a handheld, multi-purpose calibrator to perform field or lab tests on temperature probes or thermometers. These meters will simulate, source, measure and record K-J-T-E thermocouples, 1000, 100k, 100 RTD''s and thermistors.
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Petracarbon Pte Ltd
World’s most comprehensive offering of spring probe based solutions, including: contacts, connectors, interposers, semiconductor test sockets, and ATE interfaces. Proven off-the-shelf and custom products deliver the best solution for the customer’s specific application
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PPTACT1CS -
Power Probe Group, Inc.
THE PROBE 12-Volt Test Light with Haptic Feedback, (PPTACT1CS) this tool vibrates and lights when voltage over 12 volts is detected. When a voltage is below 12 volts, this functions as a standard test light. Just push the button and go! Shows positive voltage, ground, and continuity “all in one tool” with haptic advantage.
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QT2256-640 PXI -
Qmax Test Technologies Pvt. Ltd.
designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.
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William Hughes Ltd.
Our PCB test points and terminals feature a large loop for easy probe attachment or to facilitate the clipping on of other components. They are ideal for components which need frequent replacement and are also suitable for raising hot components above the surface of the PCB.
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FS2361 -
FuturePlus Systems
The FS2361 is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154/64 Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 DIMMs.
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FS2510AB -
FuturePlus Systems
The FS2510AB is a logic analyzer probe used to test DDR4 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154A/B/64A logic analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR4 DIMMs.
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FOX-1P -
Aehr Test Systems
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
